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2 article(s) from Chen, Yuhang

Subsurface imaging of flexible circuits via contact resonance atomic force microscopy

Wenting Wang,
Chengfu Ma,
Yuhang Chen,
Lei Zheng,
Huarong Liu and
Jiaru Chu

Beilstein J. Nanotechnol. 2019, 10, 1636–1647, doi:10.3762/bjnano.10.159

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Figure 1: (a) Schematic illustration of CR-AFM imaging on the flexible circuit sample. (b) An enlarged sectio...

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Figure 2: Subsurface imaging of the flexible circuit sample with a top layer thickness of 52 nm measured via ...

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Figure 3: Influence of the applied force on CR-AFM subsurface imaging of the flexible circuit sample with a 5...

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Figure 4: Influence of cantilever stiffness on CR-AFM subsurface imaging of the flexible circuit sample with ...

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Figure 5: The influence of cantilever oscillation eigenmode on CR-AFM subsurface imaging of a flexible circui...

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Figure 6: Influence of cover thickness on CR-AFM subsurface imaging of the circuit sample. (a–e) Frequency im...

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Figure 7: Influence of thickness and material properties of each layer on subsurface imaging of the circuit p...

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Figure 8: Optimization of CR-AFM subsurface imaging on a flexible circuit sample. (a,b) CR-AFM frequency imag...

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Figure 9: Subsurface imaging of defects in the buried circuit pattern using CR-AFM. (a) Schematic illustratio...

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Full Research Paper

Published 07 Aug 2019

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Material discrimination and mixture ratio estimation in nanocomposites via harmonic atomic force microscopy

Weijie Zhang,
Yuhang Chen,
Xicheng Xia and
Jiaru Chu

Beilstein J. Nanotechnol. 2017, 8, 2771–2780, doi:10.3762/bjnano.8.276

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Figure 1: Typical sixth harmonic amplitude images of a PS/LDPE blend with different amplitude set-points. (a)...

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Figure 2: Dependence of the sixth harmonic amplitude on the set-point. (a) Experimental results. (b) Numerica...

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Figure 3: Influence of drive frequency on the sixth harmonic amplitude. The fundamental free resonance freque...

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Figure 4: Harmonic amplitude contrast reversal when the drive frequency is altered. (a) Amplitude difference ...

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Figure 5: Typical harmonic amplitude images when the laser spot location on the cantilever beam is changed. T...

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Figure 6: Relation between the harmonic amplitude difference and the slope of the corresponding cantilever mo...

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Figure 7: AFM images of mixed PS and SiO₂ NPs on a silicon substrate. (a) Topography. (b) The 6th harmonic am...

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Figure 8: Harmonic AFM imaging of SiO₂/PS NPs mixed with different ratios. The two types of NPs have the same...

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Figure 9: Mixture ratio estimation of the SiO₂/PS composites.

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Full Research Paper

Published 21 Dec 2017

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